Domingo Arturo Mery Quiroz

He received the M.Sc. degree in Electrical Engineering at the Technical University of Karlsruhe (1992), and the Ph.D. degree with distinction at the Technical University of Berlin (2000). He was a Research Scientist at the Institute for Measurement and Automation Technology at the Technical University of Berlin with the collaboration of YXLON X-Ray International. He was a recipient of a Scholarship from the Konrad-Adenauer-Foundation, and from a Scholarship from the German Academic Exchange Service (DAAD). He was Associated Research in 2001 at the Department of Computer Engineering at the University of Santiago, Chile. Now, he is Full Professor at the Department of Computer Science at the Pontificia Universidad Católica de Chile, Chile. He was Chair of the Computer Science Department in 2005-2009. His research interests include image processing for fault detection in aluminum castings, X-ray imaging, real-time programming and computer vision. He is author of more than 50 technical SCI publications, and more than 60 conference papers. He is Local Co-chair of ICCV2015 (to be held in Santiago de Chile). He was program general chair of the PSIVT2007, program chair PSIVT2009 and General Co-chair of PSIVT2011 (Pacific-Rim Symposium on Image and Video Technology), and 2007 Iberoamerican Congress on Pattern Recognition. He received the Ron Halmshaw Award from British Institute of Non-destructive Testing, established for the best paper published in Insight Journal on industrial radiography in years 2005 and 2012.